Tampere University of Technology

TUTCRIS Research Portal

Johanna Virkki

  1. 2007
  2. Published

    System level reliability testing for high reliability devices

    Kuusiluoma, S., Kiilunen, J. & Virkki, J., 2007, 9th Electronics Packaging Technology Conference (EPTC 2007), December 10-12, 2007, Grand Copthorne Waterfront, Singapore. p. 897-901

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. 2009
  4. Published

    Enhanced moisture stress test method for capacitors

    Virkki, J., Frisk, L., Heino, P. & Kuusiluoma, S., 2009, 4th IEEE Conference on ICIEA, Industrial Electronics and Applications, 25-17 May 2009, Xi'an, China. p. 4001-4004

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  5. 2010
  6. Published

    Accelerated testing for failures of tantalum capacitors

    Virkki, J., Seppälä, T., Frisk, L. & Heino, P., 2010, In : Microelectronics Reliability. 50, 2, p. 217-219

    Research output: Contribution to journalArticleScientificpeer-review

  7. Published

    Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment

    Virkki, J. & Raumonen, P., 2010, In : Journal of Microelectronics and Electronic Packaging. 7, 2, p. 111-116 6 p.

    Research output: Contribution to journalArticleScientificpeer-review

  8. Published

    Development of a matrix test board for capacitor reliability testing

    Virkki, J., Koskenkorva, A. & Frisk, L., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1711-1714

    Research output: Contribution to journalArticleScientificpeer-review

  9. Published

    Improving the standard reliability tests for tantalum capacitors

    Virkki, J., 2010, Tampere: Tampere University of Technology. (Tampereen teknillinen yliopisto. Julkaisu; vol. 922)

    Research output: Book/ReportDoctoral thesisCollection of Articles

  10. Published

    Testing the effects of reflow on tantalum capacitors

    Virkki, J., Seppälä, T. & Raumonen, P., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1650-1653

    Research output: Contribution to journalArticleScientificpeer-review

  11. Published

    Testing the effects of temperature cycling on tantalum capacitors

    Virkki, J. & Tuukkanen, S., 2010, In : Microelectronics Reliability. 50, 8, p. 1121-1124

    Research output: Contribution to journalArticleScientificpeer-review

  12. Published

    Usability of HTSL and LTSL tests at component level

    Virkki, J. & Tuukkanen, S., 2010, The Seventh International New Exploratory Technologies Conference NEXT 2010, October 19-21, 2010, University of Turku, Finland. p. 1-12 12 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  13. 2011
  14. Published

    Challenges in Qualitative Accelerated Testing of WSN Hardware

    Virkki, J., Chen, L., Zhu, Y. & Meng, Y., 2011, In : Engineering. 3, 12, p. 1234-1239

    Research output: Contribution to journalArticleScientificpeer-review

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