Tampere University of Technology

TUTCRIS Research Portal

Johanna Virkki

  1. 2010
  2. Published

    Improving the standard reliability tests for tantalum capacitors

    Virkki, J., 2010, Tampere: Tampere University of Technology. (Tampereen teknillinen yliopisto. Julkaisu; vol. 922)

    Research output: Book/ReportDoctoral thesisCollection of Articles

  3. Published

    Testing the effects of reflow on tantalum capacitors

    Virkki, J., Seppälä, T. & Raumonen, P., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1650-1653

    Research output: Contribution to journalArticleScientificpeer-review

  4. Published

    Testing the effects of temperature cycling on tantalum capacitors

    Virkki, J. & Tuukkanen, S., 2010, In : Microelectronics Reliability. 50, 8, p. 1121-1124

    Research output: Contribution to journalArticleScientificpeer-review

  5. Published

    Usability of HTSL and LTSL tests at component level

    Virkki, J. & Tuukkanen, S., 2010, The Seventh International New Exploratory Technologies Conference NEXT 2010, October 19-21, 2010, University of Turku, Finland. p. 1-12 12 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  6. 2009
  7. Published

    Enhanced moisture stress test method for capacitors

    Virkki, J., Frisk, L., Heino, P. & Kuusiluoma, S., 2009, 4th IEEE Conference on ICIEA, Industrial Electronics and Applications, 25-17 May 2009, Xi'an, China. p. 4001-4004

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  8. 2007
  9. Published

    System level reliability testing for high reliability devices

    Kuusiluoma, S., Kiilunen, J. & Virkki, J., 2007, 9th Electronics Packaging Technology Conference (EPTC 2007), December 10-12, 2007, Grand Copthorne Waterfront, Singapore. p. 897-901

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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