Tampere University of Technology

TUTCRIS Research Portal

Johanna Virkki

  1. A1 Journal article-refereed
  2. Published

    Performance of UHF RFID tags printed directly on plywood structures

    Virkki, J., Merilampi, S., Ukkonen, L. & Sydänheimo, L., 2012, In : International Journal of RF Technologies. 3, 4, p. 283-302

    Research output: Contribution to journalArticleScientificpeer-review

  3. Published

    Challenges in Qualitative Accelerated Testing of WSN Hardware

    Virkki, J., Chen, L., Zhu, Y. & Meng, Y., 2011, In : Engineering. 3, 12, p. 1234-1239

    Research output: Contribution to journalArticleScientificpeer-review

  4. Published

    Reliability of WSN Hardware

    Virkki, J., Zhu, Y., Meng, Y. & Chen, L., 2011, In : International Journal of Embedded Systems and Applications. 1, 2

    Research output: Contribution to journalArticleScientificpeer-review

  5. Published

    Testing the Effects of Seacoast Atmosphere on Tantalum Capacitors

    Virkki, J. & Raumonen, P., 2011, In : Active and Passive Electronic Components. 2011, p. 1-9 9 p., 108423.

    Research output: Contribution to journalArticleScientificpeer-review

  6. Published

    Modifications of the 85/85 test and the temperature cycling test for tantalum capacitors

    Virkki, J., Sydänheimo, L. & Raumonen, P., 2011, In : Soldering and Surface Mount Technology. 23, 3, p. 168-176

    Research output: Contribution to journalArticleScientificpeer-review

  7. Published

    Testing the effects of reflow on tantalum capacitors

    Virkki, J., Seppälä, T. & Raumonen, P., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1650-1653

    Research output: Contribution to journalArticleScientificpeer-review

  8. Published

    Accelerated testing for failures of tantalum capacitors

    Virkki, J., Seppälä, T., Frisk, L. & Heino, P., 2010, In : Microelectronics Reliability. 50, 2, p. 217-219

    Research output: Contribution to journalArticleScientificpeer-review

  9. Published

    Testing the effects of temperature cycling on tantalum capacitors

    Virkki, J. & Tuukkanen, S., 2010, In : Microelectronics Reliability. 50, 8, p. 1121-1124

    Research output: Contribution to journalArticleScientificpeer-review

  10. Published

    Development of a matrix test board for capacitor reliability testing

    Virkki, J., Koskenkorva, A. & Frisk, L., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1711-1714

    Research output: Contribution to journalArticleScientificpeer-review

  11. Published

    Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment

    Virkki, J. & Raumonen, P., 2010, In : Journal of Microelectronics and Electronic Packaging. 7, 2, p. 111-116 6 p.

    Research output: Contribution to journalArticleScientificpeer-review

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