Johanna Virkki
- A1 Journal article-refereed
- Published
Performance of UHF RFID tags printed directly on plywood structures
Virkki, J., Merilampi, S., Ukkonen, L. & Sydänheimo, L., 2012, In : International Journal of RF Technologies. 3, 4, p. 283-302Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Challenges in Qualitative Accelerated Testing of WSN Hardware
Virkki, J., Chen, L., Zhu, Y. & Meng, Y., 2011, In : Engineering. 3, 12, p. 1234-1239Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Reliability of WSN Hardware
Virkki, J., Zhu, Y., Meng, Y. & Chen, L., 2011, In : International Journal of Embedded Systems and Applications. 1, 2Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Testing the Effects of Seacoast Atmosphere on Tantalum Capacitors
Virkki, J. & Raumonen, P., 2011, In : Active and Passive Electronic Components. 2011, p. 1-9 9 p., 108423.Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Modifications of the 85/85 test and the temperature cycling test for tantalum capacitors
Virkki, J., Sydänheimo, L. & Raumonen, P., 2011, In : Soldering and Surface Mount Technology. 23, 3, p. 168-176Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Testing the effects of reflow on tantalum capacitors
Virkki, J., Seppälä, T. & Raumonen, P., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1650-1653Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Accelerated testing for failures of tantalum capacitors
Virkki, J., Seppälä, T., Frisk, L. & Heino, P., 2010, In : Microelectronics Reliability. 50, 2, p. 217-219Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Testing the effects of temperature cycling on tantalum capacitors
Virkki, J. & Tuukkanen, S., 2010, In : Microelectronics Reliability. 50, 8, p. 1121-1124Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Development of a matrix test board for capacitor reliability testing
Virkki, J., Koskenkorva, A. & Frisk, L., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1711-1714Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
- Published
Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment
Virkki, J. & Raumonen, P., 2010, In : Journal of Microelectronics and Electronic Packaging. 7, 2, p. 111-116 6 p.Research output: Contribution to journal › Article › Scientific › peer-review
Full text:
ID: 75693