Johanna Virkki
- A1 Journal article-refereed
- Published
A Selective Ink Deposition Method for the Cost-Performance Optimization of Inkjet-Printed UHF RFID Tag Antennas
Virtanen, J., Virkki, J., Elsherbeni, A. Z., Sydänheimo, L. & Ukkonen, L., 2012, In : International Journal of Antennas and Propagation. 2012, p. 1-9 9 p., 801014.Research output: Contribution to journal › Article › Scientific › peer-review
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- Published
Inkjet-Printed UHF RFID Tags on Renewable Materials
Virtanen, J., Virkki, J., Ukkonen, L. & Sydänheimo, L., 2012, In : Advances in Internet of Things. 2, 4, p. 79-85Research output: Contribution to journal › Article › Scientific › peer-review
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Performance of UHF RFID tags printed directly on plywood structures
Virkki, J., Merilampi, S., Ukkonen, L. & Sydänheimo, L., 2012, In : International Journal of RF Technologies. 3, 4, p. 283-302Research output: Contribution to journal › Article › Scientific › peer-review
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Challenges in Qualitative Accelerated Testing of WSN Hardware
Virkki, J., Chen, L., Zhu, Y. & Meng, Y., 2011, In : Engineering. 3, 12, p. 1234-1239Research output: Contribution to journal › Article › Scientific › peer-review
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Reliability of WSN Hardware
Virkki, J., Zhu, Y., Meng, Y. & Chen, L., 2011, In : International Journal of Embedded Systems and Applications. 1, 2Research output: Contribution to journal › Article › Scientific › peer-review
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Testing the Effects of Seacoast Atmosphere on Tantalum Capacitors
Virkki, J. & Raumonen, P., 2011, In : Active and Passive Electronic Components. 2011, p. 1-9 9 p., 108423.Research output: Contribution to journal › Article › Scientific › peer-review
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Modifications of the 85/85 test and the temperature cycling test for tantalum capacitors
Virkki, J., Sydänheimo, L. & Raumonen, P., 2011, In : Soldering and Surface Mount Technology. 23, 3, p. 168-176Research output: Contribution to journal › Article › Scientific › peer-review
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Testing the effects of reflow on tantalum capacitors
Virkki, J., Seppälä, T. & Raumonen, P., 2010, In : Microelectronics Reliability. 50, 9-11, p. 1650-1653Research output: Contribution to journal › Article › Scientific › peer-review
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Accelerated testing for failures of tantalum capacitors
Virkki, J., Seppälä, T., Frisk, L. & Heino, P., 2010, In : Microelectronics Reliability. 50, 2, p. 217-219Research output: Contribution to journal › Article › Scientific › peer-review
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Testing the effects of temperature cycling on tantalum capacitors
Virkki, J. & Tuukkanen, S., 2010, In : Microelectronics Reliability. 50, 8, p. 1121-1124Research output: Contribution to journal › Article › Scientific › peer-review
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ID: 75693