Tampere University of Technology

TUTCRIS Research Portal

Johanna Virkki

  1. 2007
  2. Published

    System level reliability testing for high reliability devices

    Kuusiluoma, S., Kiilunen, J. & Virkki, J., 2007, 9th Electronics Packaging Technology Conference (EPTC 2007), December 10-12, 2007, Grand Copthorne Waterfront, Singapore. p. 897-901

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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