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A Class of Active-RC Filters with Predictive Characteristics

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A Class of Active-RC Filters with Predictive Characteristics. / Vainio, O.; Ovaska, S. J.

1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, USA, April 24-26. 1995. p. 358-363.

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Harvard

Vainio, O & Ovaska, SJ 1995, A Class of Active-RC Filters with Predictive Characteristics. in 1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, USA, April 24-26. pp. 358-363.

APA

Vainio, O., & Ovaska, S. J. (1995). A Class of Active-RC Filters with Predictive Characteristics. In 1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, USA, April 24-26 (pp. 358-363)

Vancouver

Vainio O, Ovaska SJ. A Class of Active-RC Filters with Predictive Characteristics. In 1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, USA, April 24-26. 1995. p. 358-363

Author

Vainio, O. ; Ovaska, S. J. / A Class of Active-RC Filters with Predictive Characteristics. 1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, USA, April 24-26. 1995. pp. 358-363

Bibtex - Download

@inproceedings{d7c7540f07c342a09798bc2fc9953c9d,
title = "A Class of Active-RC Filters with Predictive Characteristics",
author = "O. Vainio and Ovaska, {S. J.}",
note = "Contribution: organisation=sgn,FACT1=1",
year = "1995",
language = "English",
pages = "358--363",
booktitle = "1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, USA, April 24-26",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - A Class of Active-RC Filters with Predictive Characteristics

AU - Vainio, O.

AU - Ovaska, S. J.

N1 - Contribution: organisation=sgn,FACT1=1

PY - 1995

Y1 - 1995

M3 - Conference contribution

SP - 358

EP - 363

BT - 1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, USA, April 24-26

ER -