A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate
Research output: Contribution to journal › Article › Scientific › peer-review
Details
Original language | English |
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Pages (from-to) | 70-75 |
Journal | Microwave and Optical Technology Letters |
Volume | 45 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2005 |
Publication type | A1 Journal article-refereed |