A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate
Research output: Contribution to journal › Article › Scientific › peer-review
Details
| Original language | English |
|---|---|
| Pages (from-to) | 70-75 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 45 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2005 |
| Publication type | A1 Journal article-refereed |