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A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate

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A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate. / Kaija, T.; Ristolainen, E.

In: Microwave and Optical Technology Letters, Vol. 45, No. 1, 2005, p. 70-75.

Research output: Contribution to journalArticleScientificpeer-review

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Kaija, T & Ristolainen, E 2005, 'A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate', Microwave and Optical Technology Letters, vol. 45, no. 1, pp. 70-75. https://doi.org/10.1002/mop.20727

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Kaija, T. ; Ristolainen, E. / A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate. In: Microwave and Optical Technology Letters. 2005 ; Vol. 45, No. 1. pp. 70-75.

Bibtex - Download

@article{ccb0e8daca8a4786bb27ab7a26e6634f,
title = "A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate",
author = "T. Kaija and E. Ristolainen",
note = "Contribution: organisation=ele,FACT1=1",
year = "2005",
doi = "10.1002/mop.20727",
language = "English",
volume = "45",
pages = "70--75",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "Wiley",
number = "1",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate

AU - Kaija, T.

AU - Ristolainen, E.

N1 - Contribution: organisation=ele,FACT1=1

PY - 2005

Y1 - 2005

U2 - 10.1002/mop.20727

DO - 10.1002/mop.20727

M3 - Article

VL - 45

SP - 70

EP - 75

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

SN - 0895-2477

IS - 1

ER -