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A Defect Detection Scheme for Web Surface Inspection

Research output: Contribution to journalArticleScientificpeer-review

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A Defect Detection Scheme for Web Surface Inspection. / Iivarinen, J.; Heikkinen, K.; Rauhamaa, J.; Vuorimaa, P.; Visa, A.

In: International Journal of Pattern Recognition and Artificial Intelligence, Vol. 14, No. 6, 2000, p. 735-755.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Iivarinen, J, Heikkinen, K, Rauhamaa, J, Vuorimaa, P & Visa, A 2000, 'A Defect Detection Scheme for Web Surface Inspection', International Journal of Pattern Recognition and Artificial Intelligence, vol. 14, no. 6, pp. 735-755.

APA

Iivarinen, J., Heikkinen, K., Rauhamaa, J., Vuorimaa, P., & Visa, A. (2000). A Defect Detection Scheme for Web Surface Inspection. International Journal of Pattern Recognition and Artificial Intelligence, 14(6), 735-755.

Vancouver

Iivarinen J, Heikkinen K, Rauhamaa J, Vuorimaa P, Visa A. A Defect Detection Scheme for Web Surface Inspection. International Journal of Pattern Recognition and Artificial Intelligence. 2000;14(6):735-755.

Author

Iivarinen, J. ; Heikkinen, K. ; Rauhamaa, J. ; Vuorimaa, P. ; Visa, A. / A Defect Detection Scheme for Web Surface Inspection. In: International Journal of Pattern Recognition and Artificial Intelligence. 2000 ; Vol. 14, No. 6. pp. 735-755.

Bibtex - Download

@article{0e78e141427f4f3797fe7c456f677fcf,
title = "A Defect Detection Scheme for Web Surface Inspection",
author = "J. Iivarinen and K. Heikkinen and J. Rauhamaa and P. Vuorimaa and A. Visa",
note = "Contribution: organisation=sgn,FACT1=1",
year = "2000",
language = "English",
volume = "14",
pages = "735--755",
journal = "International Journal of Pattern Recognition and Artificial Intelligence",
issn = "0218-0014",
publisher = "World Scientific Publishing",
number = "6",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - A Defect Detection Scheme for Web Surface Inspection

AU - Iivarinen, J.

AU - Heikkinen, K.

AU - Rauhamaa, J.

AU - Vuorimaa, P.

AU - Visa, A.

N1 - Contribution: organisation=sgn,FACT1=1

PY - 2000

Y1 - 2000

M3 - Article

VL - 14

SP - 735

EP - 755

JO - International Journal of Pattern Recognition and Artificial Intelligence

JF - International Journal of Pattern Recognition and Artificial Intelligence

SN - 0218-0014

IS - 6

ER -