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A novel model order reduction technique based on simulated annealing

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publicationICM 2016 - 28th International Conference on Microelectronics
PublisherIEEE
Pages241-244
Number of pages4
ISBN (Electronic)9781509057214
DOIs
Publication statusPublished - 8 Feb 2017
Publication typeA4 Article in a conference publication
EventInternational Conference on Microelectronics -
Duration: 1 Jan 2000 → …

Conference

ConferenceInternational Conference on Microelectronics
Period1/01/00 → …

Abstract

In this paper, a novel and efficient solution in the area of model order reduction is presented. The proposed method depends on a global optimization algorithm called simulated annealing. This approach aims to obtain a reduced-order model out of a relatively complex model represented as a transfer function. This reduced order model is obtained in a reasonable run time; it has an acceptable error in time domain represented by the unit step time response, and the least error in the frequency domain represented by Bode plot compared to other conventional mathematical methods used in model order reduction. This work can be used in the CAD tools that reduce the complexity of passive elements.

ASJC Scopus subject areas

Keywords

  • Mean Square Error, Model Order Reduction, Optimization, Simulated Annealing, Transfer Function

Publication forum classification

Field of science, Statistics Finland