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A novel RFID-enabled strain sensor using the double power measurement technique

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publication2014 IEEE MTT-S International Microwave Symposium (IMS), 1-6 June 2014, Tampa, FL, USA
PublisherInstitute of Electrical and Electronics Engineers IEEE
Pages1-4
Number of pages4
ISBN (Print)978·1-4799-3869-8
DOIs
Publication statusPublished - 2014
Publication typeA4 Article in a conference publication
EventInternational Microwave Symposium -
Duration: 1 Jan 2014 → …

Conference

ConferenceInternational Microwave Symposium
Period1/01/14 → …

Publication forum classification