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A novel test fixture with enhsnced signal port isolation capability for on-wafer microwave measurements

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publicationICMTS 2005. The 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, Leuven, Belgium
Pages177-181
Publication statusPublished - 2005
Publication typeA4 Article in a conference publication

Publication forum classification