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Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment

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Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment. / Virkki, Johanna; Raumonen, Pasi.

In: Journal of Microelectronics and Electronic Packaging, Vol. 7, No. 2, 2010, p. 111-116.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Virkki, J & Raumonen, P 2010, 'Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment', Journal of Microelectronics and Electronic Packaging, vol. 7, no. 2, pp. 111-116.

APA

Vancouver

Author

Virkki, Johanna ; Raumonen, Pasi. / Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment. In: Journal of Microelectronics and Electronic Packaging. 2010 ; Vol. 7, No. 2. pp. 111-116.

Bibtex - Download

@article{d518359fb79b44bfa789fd67520da482,
title = "Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment",
author = "Johanna Virkki and Pasi Raumonen",
note = "Contribution: organisation=ele rr,FACT1=1",
year = "2010",
language = "English",
volume = "7",
pages = "111--116",
journal = "Journal of Microelectronics and Electronic Packaging",
issn = "1551-4897",
publisher = "IMAPS-International Microelectronics and Packaging Society",
number = "2",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Accelerated tests for the effects of power cycling on tantalum capacitors in a humid environment

AU - Virkki, Johanna

AU - Raumonen, Pasi

N1 - Contribution: organisation=ele rr,FACT1=1

PY - 2010

Y1 - 2010

M3 - Article

VL - 7

SP - 111

EP - 116

JO - Journal of Microelectronics and Electronic Packaging

JF - Journal of Microelectronics and Electronic Packaging

SN - 1551-4897

IS - 2

ER -