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Application of wide-band material parameter extraction techniques to printable electronics characterization

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publicationECTC 2009, 59th Electronic Components & Technology Conference, May 26-29, 2009, San Diego, USA
Pages1342-1348
DOIs
Publication statusPublished - 2009
Publication typeA4 Article in a conference publication

Publication forum classification