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Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

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Details

Original languageEnglish
Pages (from-to)75-81
JournalMaterials Science in Semiconductor Processing
Volume12
Issue number1-2, Spec.Issue
DOIs
Publication statusPublished - 2009
Externally publishedYes
Publication typeA1 Journal article-refereed

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