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Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

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Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction. / Zolotaryov, A.; Schramm, A.; Heyn, C.; Zozulya, A.; Hansen, W.

In: Materials Science in Semiconductor Processing, Vol. 12, No. 1-2, Spec.Issue, 2009, p. 75-81.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Zolotaryov, A, Schramm, A, Heyn, C, Zozulya, A & Hansen, W 2009, 'Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction', Materials Science in Semiconductor Processing, vol. 12, no. 1-2, Spec.Issue, pp. 75-81. https://doi.org/10.1016/j.mssp.2009.07.009

APA

Zolotaryov, A., Schramm, A., Heyn, C., Zozulya, A., & Hansen, W. (2009). Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction. Materials Science in Semiconductor Processing, 12(1-2, Spec.Issue), 75-81. https://doi.org/10.1016/j.mssp.2009.07.009

Vancouver

Zolotaryov A, Schramm A, Heyn C, Zozulya A, Hansen W. Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction. Materials Science in Semiconductor Processing. 2009;12(1-2, Spec.Issue):75-81. https://doi.org/10.1016/j.mssp.2009.07.009

Author

Zolotaryov, A. ; Schramm, A. ; Heyn, C. ; Zozulya, A. ; Hansen, W. / Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction. In: Materials Science in Semiconductor Processing. 2009 ; Vol. 12, No. 1-2, Spec.Issue. pp. 75-81.

Bibtex - Download

@article{8774e700d23b44fd9d15fccef8772af6,
title = "Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction",
author = "A. Zolotaryov and A. Schramm and C. Heyn and A. Zozulya and W. Hansen",
note = "Contribution: organisation=orc,FACT1=1",
year = "2009",
doi = "10.1016/j.mssp.2009.07.009",
language = "English",
volume = "12",
pages = "75--81",
journal = "Materials Science in Semiconductor Processing",
issn = "1369-8001",
publisher = "Elsevier",
number = "1-2, Spec.Issue",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

AU - Zolotaryov, A.

AU - Schramm, A.

AU - Heyn, C.

AU - Zozulya, A.

AU - Hansen, W.

N1 - Contribution: organisation=orc,FACT1=1

PY - 2009

Y1 - 2009

U2 - 10.1016/j.mssp.2009.07.009

DO - 10.1016/j.mssp.2009.07.009

M3 - Article

VL - 12

SP - 75

EP - 81

JO - Materials Science in Semiconductor Processing

JF - Materials Science in Semiconductor Processing

SN - 1369-8001

IS - 1-2, Spec.Issue

ER -