Tampere University of Technology

TUTCRIS Research Portal

Characterizing leakage current in silicon nanowire-based field-effect transistors by applying pseudo-random sequences

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publicationProceedings of Second International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 29 Aug. - 1 Sept. 2012, Xi'an, China
PublisherChangchun University of Science and Technology
Pages1-5
Number of pages5
ISBN (Electronic)978-1-4673-4589-7
ISBN (Print)978-1-4673-4588-0
Publication statusPublished - 2012
Publication typeA4 Article in a conference publication

Publication series

NameInternational Conference on Manipulation, Manufacturing and Measurement on the Nanoscale

Publication forum classification

Field of science, Statistics Finland