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Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

Details

Original languageEnglish
Title of host publicationKelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Place of PublicationBerlin, Germany
PublisherSpringer
Pages69-97
Number of pages29
ISBN (Electronic)978-3-642-22566-6
ISBN (Print)978-3-642-22565-9
DOIs
Publication statusPublished - 2012
Publication typeA3 Part of a book or another research book

Publication series

NameSpringer Series in Surface Sciences
PublisherSpringer
Volume48
ISSN (Print)0931-5195

Publication forum classification

Field of science, Statistics Finland