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Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale

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Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale. / Nony, L.; Bocquet, F.; Foster, A.S.; Loppacher, C.

Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces. Berlin, Germany : Springer, 2012. p. 69-97 (Springer Series in Surface Sciences; Vol. 48).

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

Harvard

Nony, L, Bocquet, F, Foster, AS & Loppacher, C 2012, Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale. in Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces. Springer Series in Surface Sciences, vol. 48, Springer, Berlin, Germany, pp. 69-97. https://doi.org/10.1007/978-3-642-22566-6_5

APA

Nony, L., Bocquet, F., Foster, A. S., & Loppacher, C. (2012). Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale. In Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces (pp. 69-97). (Springer Series in Surface Sciences; Vol. 48). Berlin, Germany: Springer. https://doi.org/10.1007/978-3-642-22566-6_5

Vancouver

Nony L, Bocquet F, Foster AS, Loppacher C. Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale. In Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces. Berlin, Germany: Springer. 2012. p. 69-97. (Springer Series in Surface Sciences). https://doi.org/10.1007/978-3-642-22566-6_5

Author

Nony, L. ; Bocquet, F. ; Foster, A.S. ; Loppacher, C. / Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale. Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces. Berlin, Germany : Springer, 2012. pp. 69-97 (Springer Series in Surface Sciences).

Bibtex - Download

@inbook{f50c192232614b33aee2cd84b026e2f6,
title = "Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale",
author = "L. Nony and F. Bocquet and A.S. Foster and C. Loppacher",
note = "Contribution: organisation=fys,FACT1=1<br/>Portfolio EDEND: 2013-12-29",
year = "2012",
doi = "10.1007/978-3-642-22566-6_5",
language = "English",
isbn = "978-3-642-22565-9",
series = "Springer Series in Surface Sciences",
publisher = "Springer",
pages = "69--97",
booktitle = "Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces",

}

RIS (suitable for import to EndNote) - Download

TY - CHAP

T1 - Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale

AU - Nony, L.

AU - Bocquet, F.

AU - Foster, A.S.

AU - Loppacher, C.

N1 - Contribution: organisation=fys,FACT1=1<br/>Portfolio EDEND: 2013-12-29

PY - 2012

Y1 - 2012

U2 - 10.1007/978-3-642-22566-6_5

DO - 10.1007/978-3-642-22566-6_5

M3 - Chapter

SN - 978-3-642-22565-9

T3 - Springer Series in Surface Sciences

SP - 69

EP - 97

BT - Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces

PB - Springer

CY - Berlin, Germany

ER -