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Correlation of component human body model and charged device model qualification levels with electrical failures in electronics assembly

Research output: Contribution to journalArticleScientificpeer-review

Details

Original languageEnglish
Pages (from-to)38-44
Number of pages7
JournalJournal of Electrostatics
Volume79
DOIs
Publication statusPublished - Feb 2016
Publication typeA1 Journal article-refereed

Abstract

Electrostatic discharge sensitivity of integrated circuits is compared with electrical failure levels in electronics assembly. Electrical components with a low electrostatic discharge withstand voltage would be expected to have more electrical failures than more robust components. However, the analysis based on 47 products, 14 facilities, and 6 billion integrated circuits show no correlation between electrical failures and electrostatic discharge sensitivity of components. This was found when the withstand voltage of the components is equal or higher than 100 V human body model and 200 V charged device model. (c) 2015 Elsevier B.V. All rights reserved.

Keywords

  • ESD, HBM, CDM, Electrical failures, Assembly

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