Tampere University of Technology

TUTCRIS Research Portal

Depth profiles of defects in CdTe (100) overlayers grown by molecular beam epitaxy on GaAs(100)

Research output: Contribution to journalArticleScientificpeer-review

Details

Original languageEnglish
Pages (from-to)973-974
JournalApplied Physics Letters
Volume51
Issue number13
Publication statusPublished - 1987
Publication typeA1 Journal article-refereed

Publication forum classification