Tampere University of Technology

TUTCRIS Research Portal

Editor's Note

Research output: Contribution to journalArticleScientificpeer-review

Standard

Editor's Note. / Zabih, Ramin; Kang, Sing Bing; Lawrence, Neil D.; Matas, Jiri; Welling, Max.

In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 34, No. 2, 2012, p. 209-210.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Zabih, R, Kang, SB, Lawrence, ND, Matas, J & Welling, M 2012, 'Editor's Note', IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 34, no. 2, pp. 209-210. https://doi.org/10.1109/TPAMI.2012.14

APA

Zabih, R., Kang, S. B., Lawrence, N. D., Matas, J., & Welling, M. (2012). Editor's Note. IEEE Transactions on Pattern Analysis and Machine Intelligence, 34(2), 209-210. https://doi.org/10.1109/TPAMI.2012.14

Vancouver

Zabih R, Kang SB, Lawrence ND, Matas J, Welling M. Editor's Note. IEEE Transactions on Pattern Analysis and Machine Intelligence. 2012;34(2):209-210. https://doi.org/10.1109/TPAMI.2012.14

Author

Zabih, Ramin ; Kang, Sing Bing ; Lawrence, Neil D. ; Matas, Jiri ; Welling, Max. / Editor's Note. In: IEEE Transactions on Pattern Analysis and Machine Intelligence. 2012 ; Vol. 34, No. 2. pp. 209-210.

Bibtex - Download

@article{dc7ca76d507043948b33e5bc4845793f,
title = "Editor's Note",
author = "Ramin Zabih and Kang, {Sing Bing} and Lawrence, {Neil D.} and Jiri Matas and Max Welling",
year = "2012",
doi = "10.1109/TPAMI.2012.14",
language = "English",
volume = "34",
pages = "209--210",
journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",
issn = "0162-8828",
publisher = "IEEE COMPUTER SOC",
number = "2",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Editor's Note

AU - Zabih, Ramin

AU - Kang, Sing Bing

AU - Lawrence, Neil D.

AU - Matas, Jiri

AU - Welling, Max

PY - 2012

Y1 - 2012

U2 - 10.1109/TPAMI.2012.14

DO - 10.1109/TPAMI.2012.14

M3 - Article

VL - 34

SP - 209

EP - 210

JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

SN - 0162-8828

IS - 2

ER -