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Evaluation of lateral composition modulation in Ga(As,Bi) epilayers by X-Ray diffraction

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

Details

Original languageEnglish
Title of host publication18th European Molecular Beam Epitaxy Workshop
Place of PublicationCanazei, Italy
Publication statusPublished - 15 Mar 2015
Publication typeB3 Non-refereed article in conference proceedings