Tampere University of Technology

TUTCRIS Research Portal

Evaluation of lateral composition modulation in Ga(As,Bi) epilayers by X-Ray diffraction

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific


Original languageEnglish
Title of host publication18th European Molecular Beam Epitaxy Workshop
Place of PublicationCanazei, Italy
Publication statusPublished - 15 Mar 2015
Publication typeB3 Non-refereed article in conference proceedings