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Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project

Research output: Other conference contributionPaper, poster or abstractScientific

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Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project. / Karjalainen, Panu; Keskinen, Jorma; Bainschab, Markus; Bergmann, Alexander; Jon, Andersson; Mamakos, Athanasios; Klug, Andreas; Giechaskiel, Barouch; Piacenza, Oriana; Christoph, Haisch; Ntziachristos, Leonidas; Samaras, Zissis.

2017. Paper presented at AAAR 36th Annual Conference, United States.

Research output: Other conference contributionPaper, poster or abstractScientific

Harvard

Karjalainen, P, Keskinen, J, Bainschab, M, Bergmann, A, Jon, A, Mamakos, A, Klug, A, Giechaskiel, B, Piacenza, O, Christoph, H, Ntziachristos, L & Samaras, Z 2017, 'Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project' Paper presented at AAAR 36th Annual Conference, United States, 16/10/17 - 20/10/17, .

APA

Karjalainen, P., Keskinen, J., Bainschab, M., Bergmann, A., Jon, A., Mamakos, A., ... Samaras, Z. (2017). Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project. Paper presented at AAAR 36th Annual Conference, United States.

Vancouver

Karjalainen P, Keskinen J, Bainschab M, Bergmann A, Jon A, Mamakos A et al. Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project. 2017. Paper presented at AAAR 36th Annual Conference, United States.

Author

Karjalainen, Panu ; Keskinen, Jorma ; Bainschab, Markus ; Bergmann, Alexander ; Jon, Andersson ; Mamakos, Athanasios ; Klug, Andreas ; Giechaskiel, Barouch ; Piacenza, Oriana ; Christoph, Haisch ; Ntziachristos, Leonidas ; Samaras, Zissis. / Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project. Paper presented at AAAR 36th Annual Conference, United States.

Bibtex - Download

@conference{d01c521ab839413eb2c2b491e5d5b20b,
title = "Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project",
author = "Panu Karjalainen and Jorma Keskinen and Markus Bainschab and Alexander Bergmann and Andersson Jon and Athanasios Mamakos and Andreas Klug and Barouch Giechaskiel and Oriana Piacenza and Haisch Christoph and Leonidas Ntziachristos and Zissis Samaras",
year = "2017",
language = "English",
note = "AAAR 36th Annual Conference ; Conference date: 16-10-2017 Through 20-10-2017",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Implications for the Sampling System in Extending Automotive Particle Regulations below 23 nm: First Results of the DownToTen Project

AU - Karjalainen, Panu

AU - Keskinen, Jorma

AU - Bainschab, Markus

AU - Bergmann, Alexander

AU - Jon, Andersson

AU - Mamakos, Athanasios

AU - Klug, Andreas

AU - Giechaskiel, Barouch

AU - Piacenza, Oriana

AU - Christoph, Haisch

AU - Ntziachristos, Leonidas

AU - Samaras, Zissis

PY - 2017

Y1 - 2017

M3 - Paper, poster or abstract

ER -