Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)
Research output: Contribution to journal › Article › Scientific › peer-review
Details
Original language | English |
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Pages (from-to) | 608-612 |
Journal | Applied Surface Science |
Volume | 144-45 |
DOIs | |
Publication status | Published - 1999 |
Externally published | Yes |
Publication type | A1 Journal article-refereed |