Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)
Research output: Contribution to journal › Article › Scientific › peer-review
Details
| Original language | English |
|---|---|
| Pages (from-to) | 608-612 |
| Journal | Applied Surface Science |
| Volume | 144-45 |
| DOIs | |
| Publication status | Published - 1999 |
| Externally published | Yes |
| Publication type | A1 Journal article-refereed |