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Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

Research output: Contribution to journalArticleScientificpeer-review

Details

Original languageEnglish
Pages (from-to)608-612
JournalApplied Surface Science
Volume144-45
DOIs
Publication statusPublished - 1999
Externally publishedYes
Publication typeA1 Journal article-refereed

Publication forum classification