Oxygen-related deep level defects in solid-source MBE grown GaInP
Research output: Contribution to journal › Article › Scientific › peer-review
Standard
Oxygen-related deep level defects in solid-source MBE grown GaInP. / Xiang, N.; Tukiainen, A.; Dekker, J.; Likonen, J.; Pessa, M.
In: Journal of Crystal Growth, Vol. 227-228, 2001, p. 244-248.Research output: Contribution to journal › Article › Scientific › peer-review
Harvard
APA
Vancouver
Author
Bibtex - Download
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Oxygen-related deep level defects in solid-source MBE grown GaInP
AU - Xiang, N.
AU - Tukiainen, A.
AU - Dekker, J.
AU - Likonen, J.
AU - Pessa, M.
N1 - Contribution: organisation=orc,FACT1=1
PY - 2001
Y1 - 2001
M3 - Article
VL - 227-228
SP - 244
EP - 248
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
SN - 0022-0248
ER -