Performance Metrics for a Modern BOPP Capacitor Film
Research output: Contribution to journal › Article › Scientific › peer-review
|Number of pages||9|
|Journal||IEEE Transactions on Dielectrics and Electrical Insulation|
|Publication status||Published - 1 Aug 2019|
|Publication type||A1 Journal article-refereed|
of deep traps (~1.08 eV) in the 5 µm and 10 µm film variants showing differences presumably arising from film processing. Such an electronic structure was found to be connected with ultra-low conductivity (in the range of 10-17–10-16 S/m), high breakdown strength (~700 V/µm) and negligible space charge accumulation up to temperatures of ~70 °C. It is shown that at current design stresses (~200 V/µm at ~60 °C) BOPP is operated close to its fundamental thermal and electrical limitations. Voltage endurance tests at higher fields revealed the onset of high-field degradation and drastically reduced insulation life, and thermal activation of deep traps in the high temperature region (~100 °C) was found to result in reduced dielectric performance.