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Power MOSFET failure and degradation mechanisms in flyback topology under high temperature and high humidity conditions

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publication2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives, SDEMPED 2013, Valencia, Spain, 27-30.8.2013
PublisherInstitute of Electrical and Electronics Engineers IEEE
Pages16-22
Number of pages7
ISBN (Print)978-1-4799-0025-1
DOIs
Publication statusPublished - 2013
Publication typeA4 Article in a conference publication

Publication series

NameIEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives

Publication forum classification