Tampere University of Technology

TUTCRIS Research Portal

Reliability Analysis of RFID Tags in Changing Humid Environment

Research output: Contribution to journalArticleScientificpeer-review

Standard

Reliability Analysis of RFID Tags in Changing Humid Environment. / Saarinen, Kirsi; Björninen, Toni; Ukkonen, Leena; Frisk, Laura.

In: IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 4, No. 1, 2014, p. 77-85.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Saarinen, K, Björninen, T, Ukkonen, L & Frisk, L 2014, 'Reliability Analysis of RFID Tags in Changing Humid Environment', IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 4, no. 1, pp. 77-85. https://doi.org/10.1109/TCPMT.2013.2278182

APA

Saarinen, K., Björninen, T., Ukkonen, L., & Frisk, L. (2014). Reliability Analysis of RFID Tags in Changing Humid Environment. IEEE Transactions on Components, Packaging and Manufacturing Technology, 4(1), 77-85. https://doi.org/10.1109/TCPMT.2013.2278182

Vancouver

Saarinen K, Björninen T, Ukkonen L, Frisk L. Reliability Analysis of RFID Tags in Changing Humid Environment. IEEE Transactions on Components, Packaging and Manufacturing Technology. 2014;4(1):77-85. https://doi.org/10.1109/TCPMT.2013.2278182

Author

Saarinen, Kirsi ; Björninen, Toni ; Ukkonen, Leena ; Frisk, Laura. / Reliability Analysis of RFID Tags in Changing Humid Environment. In: IEEE Transactions on Components, Packaging and Manufacturing Technology. 2014 ; Vol. 4, No. 1. pp. 77-85.

Bibtex - Download

@article{61817fbb380e4760b3cca0c424e67a26,
title = "Reliability Analysis of RFID Tags in Changing Humid Environment",
author = "Kirsi Saarinen and Toni Bj{\"o}rninen and Leena Ukkonen and Laura Frisk",
note = "Contribution: organisation=dee,FACT1=0.8<br/>Contribution: organisation=elt,FACT2=0.2<br/>Portfolio EDEND: 2013-10-29<br/>Publisher name: Institute of Electrical and Electronics Engineers",
year = "2014",
doi = "10.1109/TCPMT.2013.2278182",
language = "English",
volume = "4",
pages = "77--85",
journal = "IEEE Transactions on Components, Packaging and Manufacturing Technology",
issn = "2156-3950",
publisher = "Institute of Electrical and Electronics Engineers",
number = "1",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Reliability Analysis of RFID Tags in Changing Humid Environment

AU - Saarinen, Kirsi

AU - Björninen, Toni

AU - Ukkonen, Leena

AU - Frisk, Laura

N1 - Contribution: organisation=dee,FACT1=0.8<br/>Contribution: organisation=elt,FACT2=0.2<br/>Portfolio EDEND: 2013-10-29<br/>Publisher name: Institute of Electrical and Electronics Engineers

PY - 2014

Y1 - 2014

U2 - 10.1109/TCPMT.2013.2278182

DO - 10.1109/TCPMT.2013.2278182

M3 - Article

VL - 4

SP - 77

EP - 85

JO - IEEE Transactions on Components, Packaging and Manufacturing Technology

JF - IEEE Transactions on Components, Packaging and Manufacturing Technology

SN - 2156-3950

IS - 1

ER -