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Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses

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Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses. / Saarinen, Kirsi; Frisk, Laura.

In: IEEE Transactions on Device and Materials Reliability, Vol. 13, No. 1, 2013, p. 119-125.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Saarinen, K & Frisk, L 2013, 'Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses', IEEE Transactions on Device and Materials Reliability, vol. 13, no. 1, pp. 119-125. https://doi.org/10.1109/TDMR.2012.2220966

APA

Saarinen, K., & Frisk, L. (2013). Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses. IEEE Transactions on Device and Materials Reliability, 13(1), 119-125. https://doi.org/10.1109/TDMR.2012.2220966

Vancouver

Saarinen K, Frisk L. Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses. IEEE Transactions on Device and Materials Reliability. 2013;13(1):119-125. https://doi.org/10.1109/TDMR.2012.2220966

Author

Saarinen, Kirsi ; Frisk, Laura. / Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses. In: IEEE Transactions on Device and Materials Reliability. 2013 ; Vol. 13, No. 1. pp. 119-125.

Bibtex - Download

@article{65c209d55f394df8a19a1cc9fdbbd0d8,
title = "Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses",
author = "Kirsi Saarinen and Laura Frisk",
note = "Contribution: organisation=dee,FACT1=1<br/>Portfolio EDEND: 2013-10-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE",
year = "2013",
doi = "10.1109/TDMR.2012.2220966",
language = "English",
volume = "13",
pages = "119--125",
journal = "IEEE Transactions on Device and Materials Reliability",
issn = "1530-4388",
publisher = "Institute of Electrical and Electronics Engineers",
number = "1",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses

AU - Saarinen, Kirsi

AU - Frisk, Laura

N1 - Contribution: organisation=dee,FACT1=1<br/>Portfolio EDEND: 2013-10-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE

PY - 2013

Y1 - 2013

U2 - 10.1109/TDMR.2012.2220966

DO - 10.1109/TDMR.2012.2220966

M3 - Article

VL - 13

SP - 119

EP - 125

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

SN - 1530-4388

IS - 1

ER -