Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography
Research output: Contribution to journal › Article › Scientific › peer-review
Details
| Original language | English |
|---|---|
| Pages (from-to) | 507-513 |
| Number of pages | 7 |
| Journal | Applied Optics |
| Volume | 57 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 20 Jan 2018 |
| Publication type | A1 Journal article-refereed |
Abstract
Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As2S3−Se and thin films As2S3. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.