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Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography

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Details

Original languageEnglish
Pages (from-to)507-513
Number of pages7
JournalApplied Optics
Volume57
Issue number3
DOIs
Publication statusPublished - 20 Jan 2018
Publication typeA1 Journal article-refereed

Abstract

Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As2S3−Se and thin films As2S3. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.

Publication forum classification

Field of science, Statistics Finland