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System level reliability testing for high reliability devices

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publication9th Electronics Packaging Technology Conference (EPTC 2007), December 10-12, 2007, Grand Copthorne Waterfront, Singapore
Pages897-901
DOIs
Publication statusPublished - 2007
Publication typeA4 Article in a conference publication

Publication forum classification