Tampere University of Technology

TUTCRIS Research Portal

Testing the effects of reflow on tantalum capacitors

Research output: Contribution to journalArticleScientificpeer-review

Details

Original languageEnglish
Pages (from-to)1650-1653
JournalMicroelectronics Reliability
Volume50
Issue number9-11
DOIs
Publication statusPublished - 2010
Publication typeA1 Journal article-refereed

Publication forum classification