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Testing the effects of temperature cycling on tantalum capacitors

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Testing the effects of temperature cycling on tantalum capacitors. / Virkki, Johanna; Tuukkanen, Sampo.

In: Microelectronics Reliability, Vol. 50, No. 8, 2010, p. 1121-1124.

Research output: Contribution to journalArticleScientificpeer-review

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Virkki, Johanna ; Tuukkanen, Sampo. / Testing the effects of temperature cycling on tantalum capacitors. In: Microelectronics Reliability. 2010 ; Vol. 50, No. 8. pp. 1121-1124.

Bibtex - Download

@article{83a0a18ea95347e0b8d89991350285cc,
title = "Testing the effects of temperature cycling on tantalum capacitors",
author = "Johanna Virkki and Sampo Tuukkanen",
note = "Contribution: organisation=ele rr,FACT1=1",
year = "2010",
doi = "10.1016/j.microrel.2010.04.013",
language = "English",
volume = "50",
pages = "1121--1124",
journal = "Microelectronics Reliability",
issn = "0026-2714",
publisher = "Elsevier",
number = "8",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Testing the effects of temperature cycling on tantalum capacitors

AU - Virkki, Johanna

AU - Tuukkanen, Sampo

N1 - Contribution: organisation=ele rr,FACT1=1

PY - 2010

Y1 - 2010

U2 - 10.1016/j.microrel.2010.04.013

DO - 10.1016/j.microrel.2010.04.013

M3 - Article

VL - 50

SP - 1121

EP - 1124

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

IS - 8

ER -