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The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publicationElectrical Overstress / Electrostatic Discharge Symposium Proceedings 2015
Place of PublicationUSA
PublisherIEEE COMPUTER SOC
Number of pages10
Volume2015
ISBN (Print)9781479988952
DOIs
Publication statusPublished - 27 Sep 2015
Publication typeA4 Article in a conference publication
EventElectrical Overstress/Electrostatic Discharge Symposium -
Duration: 1 Jan 1900 → …

Conference

ConferenceElectrical Overstress/Electrostatic Discharge Symposium
Period1/01/00 → …

Abstract

EC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.

ASJC Scopus subject areas

Keywords

  • USB, IEC61000-4-2, ESD, EMC, cable

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