Tampere University of Technology

TUTCRIS Research Portal

The role of nitrogen-related defects in high-k dielectric oxides: Density-functional studies

Research output: Contribution to journalArticleScientificpeer-review

Details

Original languageEnglish
Pages (from-to)13 p
JournalJournal of Applied Physics
Volume97
Issue number5, 053704
DOIs
Publication statusPublished - 2005
Externally publishedYes
Publication typeA1 Journal article-refereed

Publication forum classification