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Web-Wide transmittance imaging measurement variability analysis

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Standard

Web-Wide transmittance imaging measurement variability analysis. / Ylisaari, Johanna; Ritala, Risto.

International Control Systems Program 2010, September 15-17, 2010, Stockholm, Sweden. SPCI, 2010. p. 118-123.

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Harvard

Ylisaari, J & Ritala, R 2010, Web-Wide transmittance imaging measurement variability analysis. in International Control Systems Program 2010, September 15-17, 2010, Stockholm, Sweden. SPCI, pp. 118-123.

APA

Ylisaari, J., & Ritala, R. (2010). Web-Wide transmittance imaging measurement variability analysis. In International Control Systems Program 2010, September 15-17, 2010, Stockholm, Sweden (pp. 118-123). SPCI.

Vancouver

Ylisaari J, Ritala R. Web-Wide transmittance imaging measurement variability analysis. In International Control Systems Program 2010, September 15-17, 2010, Stockholm, Sweden. SPCI. 2010. p. 118-123

Author

Ylisaari, Johanna ; Ritala, Risto. / Web-Wide transmittance imaging measurement variability analysis. International Control Systems Program 2010, September 15-17, 2010, Stockholm, Sweden. SPCI, 2010. pp. 118-123

Bibtex - Download

@inproceedings{8f06b9bb0a444e76921b3a38262801e9,
title = "Web-Wide transmittance imaging measurement variability analysis",
author = "Johanna Ylisaari and Risto Ritala",
note = "Contribution: organisation=ase mit,FACT1=1",
year = "2010",
language = "English",
pages = "118--123",
booktitle = "International Control Systems Program 2010, September 15-17, 2010, Stockholm, Sweden",
publisher = "SPCI",
address = "Sweden",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - Web-Wide transmittance imaging measurement variability analysis

AU - Ylisaari, Johanna

AU - Ritala, Risto

N1 - Contribution: organisation=ase mit,FACT1=1

PY - 2010

Y1 - 2010

M3 - Conference contribution

SP - 118

EP - 123

BT - International Control Systems Program 2010, September 15-17, 2010, Stockholm, Sweden

PB - SPCI

ER -