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X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Details

Original languageEnglish
Title of host publicationProceedings of SPIE Correlation Optics
EditorsO. V. Angelsky
PublisherSPIE
Pages229-237
Publication statusPublished - 2004
Publication typeA4 Article in a conference publication
EventSPIE CONFERENCE PROCEEDINGS -
Duration: 1 Jan 1900 → …

Conference

ConferenceSPIE CONFERENCE PROCEEDINGS
Period1/01/00 → …

Publication forum classification