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X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs. / Pessa, M.; Pavelescu, E.-M.; Fodchuk, I.M.; Gevyk, V.B.; Shpak, A.P.; Molodkin, V.B.; Kislovskii, E.N.; Olikhovskii, S.I.

Proceedings of SPIE Correlation Optics. ed. / O. V. Angelsky. SPIE, 2004. p. 229-237.

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Harvard

Pessa, M, Pavelescu, E-M, Fodchuk, IM, Gevyk, VB, Shpak, AP, Molodkin, VB, Kislovskii, EN & Olikhovskii, SI 2004, X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs. in OV Angelsky (ed.), Proceedings of SPIE Correlation Optics. SPIE, pp. 229-237, SPIE CONFERENCE PROCEEDINGS, 1/01/00.

APA

Pessa, M., Pavelescu, E-M., Fodchuk, I. M., Gevyk, V. B., Shpak, A. P., Molodkin, V. B., ... Olikhovskii, S. I. (2004). X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs. In O. V. Angelsky (Ed.), Proceedings of SPIE Correlation Optics (pp. 229-237). SPIE.

Vancouver

Pessa M, Pavelescu E-M, Fodchuk IM, Gevyk VB, Shpak AP, Molodkin VB et al. X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs. In Angelsky OV, editor, Proceedings of SPIE Correlation Optics. SPIE. 2004. p. 229-237

Author

Pessa, M. ; Pavelescu, E.-M. ; Fodchuk, I.M. ; Gevyk, V.B. ; Shpak, A.P. ; Molodkin, V.B. ; Kislovskii, E.N. ; Olikhovskii, S.I. / X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs. Proceedings of SPIE Correlation Optics. editor / O. V. Angelsky. SPIE, 2004. pp. 229-237

Bibtex - Download

@inproceedings{da3405416d6d41b49c1ca551fc9cfdfc,
title = "X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs",
author = "M. Pessa and E.-M. Pavelescu and I.M. Fodchuk and V.B. Gevyk and A.P. Shpak and V.B. Molodkin and E.N. Kislovskii and S.I. Olikhovskii",
note = "ISBN 0-8194-5403-6, ISSN 0277-786X<br/>Contribution: organisation=orc,FACT1=1",
year = "2004",
language = "English",
pages = "229--237",
editor = "Angelsky, {O. V.}",
booktitle = "Proceedings of SPIE Correlation Optics",
publisher = "SPIE",
address = "United States",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - X-ray analysis of strain relaxation in multilayer systems InxGa1-xAs1-yNy / GaAs

AU - Pessa, M.

AU - Pavelescu, E.-M.

AU - Fodchuk, I.M.

AU - Gevyk, V.B.

AU - Shpak, A.P.

AU - Molodkin, V.B.

AU - Kislovskii, E.N.

AU - Olikhovskii, S.I.

N1 - ISBN 0-8194-5403-6, ISSN 0277-786X<br/>Contribution: organisation=orc,FACT1=1

PY - 2004

Y1 - 2004

M3 - Conference contribution

SP - 229

EP - 237

BT - Proceedings of SPIE Correlation Optics

A2 - Angelsky, O. V.

PB - SPIE

ER -