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X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments

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X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments. / Kanerva, M.; Saarela, O.

In: International Journal of Adhesion and Adhesives, Vol. 39, 2012, p. 60-67.

Research output: Contribution to journalArticleScientificpeer-review

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@article{87ab1289db6243078bf72cbad8feb490,
title = "X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments",
author = "M. Kanerva and O. Saarela",
year = "2012",
doi = "10.1016/j.ijadhadh.2012.07.005",
language = "Ei tiedossa",
volume = "39",
pages = "60--67",
journal = "International Journal of Adhesion and Adhesives",
issn = "0143-7496",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments

AU - Kanerva, M.

AU - Saarela, O.

PY - 2012

Y1 - 2012

U2 - 10.1016/j.ijadhadh.2012.07.005

DO - 10.1016/j.ijadhadh.2012.07.005

M3 - Article

VL - 39

SP - 60

EP - 67

JO - International Journal of Adhesion and Adhesives

JF - International Journal of Adhesion and Adhesives

SN - 0143-7496

ER -