X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments

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X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments. / Kanerva, M.; Saarela, O.

In: International Journal of Adhesion and Adhesives, Vol. 39, 2012, p. 60-67.

Research output: Contribution to journal › Article › Scientific › peer-review

Bibtex - Download

@article{87ab1289db6243078bf72cbad8feb490,

title = "X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments",

author = "M. Kanerva and O. Saarela",

year = "2012",

doi = "10.1016/j.ijadhadh.2012.07.005",

language = "Ei tiedossa",

volume = "39",

pages = "60--67",

journal = "International Journal of Adhesion and Adhesives",

issn = "0143-7496",

publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - X-ray diffraction and fracture based analysis of residual stresses in stainless steel-epoxy interfaces with electropolishing and acid etching substrate treatments

AU - Kanerva, M.

AU - Saarela, O.

PY - 2012

Y1 - 2012

U2 - 10.1016/j.ijadhadh.2012.07.005

DO - 10.1016/j.ijadhadh.2012.07.005

M3 - Article

VL - 39

SP - 60

EP - 67

JO - International Journal of Adhesion and Adhesives

JF - International Journal of Adhesion and Adhesives

SN - 0143-7496

ER -

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