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X-ray diffraction investigations pf InxGa1-xAs1-yNy/GaAs multilayered structure

Research output: Contribution to journalArticleScientificpeer-review

Details

Original languageEnglish
Pages (from-to)477-495
JournalMetallofizika i Noveishie Tekhnologii
Volume24
Issue number4
Publication statusPublished - 2002
Publication typeA1 Journal article-refereed

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