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A New Class of Detail-Preserving Filters for Image Processing

Tutkimustuotosvertaisarvioitu

Standard

A New Class of Detail-Preserving Filters for Image Processing. / Nieminen, A.; Heinonen, P.; Neuvo, Y.

julkaisussa: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vuosikerta PAMI-9, Nro 1, 1987, s. 74-90.

Tutkimustuotosvertaisarvioitu

Harvard

Nieminen, A, Heinonen, P & Neuvo, Y 1987, 'A New Class of Detail-Preserving Filters for Image Processing', IEEE Transactions on Pattern Analysis and Machine Intelligence, Vuosikerta. PAMI-9, Nro 1, Sivut 74-90.

APA

Nieminen, A., Heinonen, P., & Neuvo, Y. (1987). A New Class of Detail-Preserving Filters for Image Processing. IEEE Transactions on Pattern Analysis and Machine Intelligence, PAMI-9(1), 74-90.

Vancouver

Nieminen A, Heinonen P, Neuvo Y. A New Class of Detail-Preserving Filters for Image Processing. IEEE Transactions on Pattern Analysis and Machine Intelligence. 1987;PAMI-9(1):74-90.

Author

Nieminen, A. ; Heinonen, P. ; Neuvo, Y. / A New Class of Detail-Preserving Filters for Image Processing. Julkaisussa: IEEE Transactions on Pattern Analysis and Machine Intelligence. 1987 ; Vuosikerta PAMI-9, Nro 1. Sivut 74-90.

Bibtex - Lataa

@article{6ee0b50f66ab44b7a572e2071d9ce179,
title = "A New Class of Detail-Preserving Filters for Image Processing",
author = "A. Nieminen and P. Heinonen and Y. Neuvo",
note = "Contribution: organisation=sgn,FACT1=1",
year = "1987",
language = "English",
volume = "PAMI-9",
pages = "74--90",
journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",
issn = "0162-8828",
publisher = "IEEE COMPUTER SOC",
number = "1",

}

RIS (suitable for import to EndNote) - Lataa

TY - JOUR

T1 - A New Class of Detail-Preserving Filters for Image Processing

AU - Nieminen, A.

AU - Heinonen, P.

AU - Neuvo, Y.

N1 - Contribution: organisation=sgn,FACT1=1

PY - 1987

Y1 - 1987

M3 - Article

VL - PAMI-9

SP - 74

EP - 90

JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

SN - 0162-8828

IS - 1

ER -