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A novel model order reduction technique based on simulated annealing

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
OtsikkoICM 2016 - 28th International Conference on Microelectronics
KustantajaIEEE
Sivut241-244
Sivumäärä4
ISBN (elektroninen)9781509057214
DOI - pysyväislinkit
TilaJulkaistu - 8 helmikuuta 2017
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
TapahtumaInternational Conference on Microelectronics -
Kesto: 1 tammikuuta 2000 → …

Conference

ConferenceInternational Conference on Microelectronics
Ajanjakso1/01/00 → …

Tiivistelmä

In this paper, a novel and efficient solution in the area of model order reduction is presented. The proposed method depends on a global optimization algorithm called simulated annealing. This approach aims to obtain a reduced-order model out of a relatively complex model represented as a transfer function. This reduced order model is obtained in a reasonable run time; it has an acceptable error in time domain represented by the unit step time response, and the least error in the frequency domain represented by Bode plot compared to other conventional mathematical methods used in model order reduction. This work can be used in the CAD tools that reduce the complexity of passive elements.

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