TUTCRIS - Tampereen teknillinen yliopisto

TUTCRIS

Active scanner control on paper machines

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
Sivut74-90
Sivumäärä17
JulkaisuJournal of Process Control
Vuosikerta72
DOI - pysyväislinkit
TilaJulkaistu - 1 joulukuuta 2018
OKM-julkaisutyyppiA1 Alkuperäisartikkeli

Tiivistelmä

The cross-directional (CD) basis weight control on paper machines is improved by optimizing the path of the scanning measurement. The optimal path results from an LQG problem and depends on how the uncertainty of the present estimate of the basis weight and the intensity of process noise vary in CD. These factors are assessed by how accurately the CD basis weight estimate predicts the measured optical transmittance with a linear adaptive model on synchronized basis weight and transmittance data. Simulations on optimized scanner path in disturbance scenarios are presented, and the practical implementation of scanner control is discussed.