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TUTCRIS

A/D converter testing with a networked prototyping board

Tutkimustuotosvertaisarvioitu

Standard

A/D converter testing with a networked prototyping board. / Lampinen, H.; Vainio, O.

IEEE Instrumentation & Measurement Technology Conference, sensing, processing, networking, Ottawa, Canada, May 19-21, 1997. 1997. s. 1454-1459.

Tutkimustuotosvertaisarvioitu

Harvard

Lampinen, H & Vainio, O 1997, A/D converter testing with a networked prototyping board. julkaisussa IEEE Instrumentation & Measurement Technology Conference, sensing, processing, networking, Ottawa, Canada, May 19-21, 1997. Sivut 1454-1459.

APA

Lampinen, H., & Vainio, O. (1997). A/D converter testing with a networked prototyping board. teoksessa IEEE Instrumentation & Measurement Technology Conference, sensing, processing, networking, Ottawa, Canada, May 19-21, 1997 (Sivut 1454-1459)

Vancouver

Lampinen H, Vainio O. A/D converter testing with a networked prototyping board. julkaisussa IEEE Instrumentation & Measurement Technology Conference, sensing, processing, networking, Ottawa, Canada, May 19-21, 1997. 1997. s. 1454-1459

Author

Lampinen, H. ; Vainio, O. / A/D converter testing with a networked prototyping board. IEEE Instrumentation & Measurement Technology Conference, sensing, processing, networking, Ottawa, Canada, May 19-21, 1997. 1997. Sivut 1454-1459

Bibtex - Lataa

@inproceedings{23564b1cc5d84f0b9411d3c2d84e1bbd,
title = "A/D converter testing with a networked prototyping board",
author = "H. Lampinen and O. Vainio",
note = "Contribution: organisation=sgn,FACT1=1",
year = "1997",
language = "English",
pages = "1454--1459",
booktitle = "IEEE Instrumentation & Measurement Technology Conference, sensing, processing, networking, Ottawa, Canada, May 19-21, 1997",

}

RIS (suitable for import to EndNote) - Lataa

TY - GEN

T1 - A/D converter testing with a networked prototyping board

AU - Lampinen, H.

AU - Vainio, O.

N1 - Contribution: organisation=sgn,FACT1=1

PY - 1997

Y1 - 1997

M3 - Conference contribution

SP - 1454

EP - 1459

BT - IEEE Instrumentation & Measurement Technology Conference, sensing, processing, networking, Ottawa, Canada, May 19-21, 1997

ER -