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Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials

Tutkimustuotosvertaisarvioitu

Standard

Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials. / Zhang, Jin; Wang, Zuobin; Ji, Ze; Tan, Chunlei; Jiang, Shilei; Liang, Haisheng; Sun, Huan.

2012 2nd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2012, 29 August - 1 Spetember 2012 Xi'an, China. Institute of Electrical and Electronics Engineers IEEE, 2012. s. 169-174 (International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale).

Tutkimustuotosvertaisarvioitu

Harvard

Zhang, J, Wang, Z, Ji, Z, Tan, C, Jiang, S, Liang, H & Sun, H 2012, Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials. julkaisussa 2012 2nd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2012, 29 August - 1 Spetember 2012 Xi'an, China. International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, Institute of Electrical and Electronics Engineers IEEE, Sivut 169-174. https://doi.org/10.1109/3M-NANO.2012.6472999

APA

Zhang, J., Wang, Z., Ji, Z., Tan, C., Jiang, S., Liang, H., & Sun, H. (2012). Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials. teoksessa 2012 2nd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2012, 29 August - 1 Spetember 2012 Xi'an, China (Sivut 169-174). (International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale). Institute of Electrical and Electronics Engineers IEEE. https://doi.org/10.1109/3M-NANO.2012.6472999

Vancouver

Zhang J, Wang Z, Ji Z, Tan C, Jiang S, Liang H et al. Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials. julkaisussa 2012 2nd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2012, 29 August - 1 Spetember 2012 Xi'an, China. Institute of Electrical and Electronics Engineers IEEE. 2012. s. 169-174. (International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale). https://doi.org/10.1109/3M-NANO.2012.6472999

Author

Zhang, Jin ; Wang, Zuobin ; Ji, Ze ; Tan, Chunlei ; Jiang, Shilei ; Liang, Haisheng ; Sun, Huan. / Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials. 2012 2nd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2012, 29 August - 1 Spetember 2012 Xi'an, China. Institute of Electrical and Electronics Engineers IEEE, 2012. Sivut 169-174 (International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale).

Bibtex - Lataa

@inproceedings{acbbf39378684217b8601a85ebfbe1b2,
title = "Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials",
author = "Jin Zhang and Zuobin Wang and Ze Ji and Chunlei Tan and Shilei Jiang and Haisheng Liang and Huan Sun",
note = "Contribution: organisation=orc,FACT1=1<br/>Portfolio EDEND: 2013-12-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE",
year = "2012",
doi = "10.1109/3M-NANO.2012.6472999",
language = "English",
isbn = "978-1-4673-4588-0",
series = "International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale",
publisher = "Institute of Electrical and Electronics Engineers IEEE",
pages = "169--174",
booktitle = "2012 2nd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2012, 29 August - 1 Spetember 2012 Xi'an, China",

}

RIS (suitable for import to EndNote) - Lataa

TY - GEN

T1 - Configurations of laser interference lithography for 2D/3D nanostructures of optical functional materials

AU - Zhang, Jin

AU - Wang, Zuobin

AU - Ji, Ze

AU - Tan, Chunlei

AU - Jiang, Shilei

AU - Liang, Haisheng

AU - Sun, Huan

N1 - Contribution: organisation=orc,FACT1=1<br/>Portfolio EDEND: 2013-12-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE

PY - 2012

Y1 - 2012

U2 - 10.1109/3M-NANO.2012.6472999

DO - 10.1109/3M-NANO.2012.6472999

M3 - Conference contribution

SN - 978-1-4673-4588-0

T3 - International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale

SP - 169

EP - 174

BT - 2012 2nd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2012, 29 August - 1 Spetember 2012 Xi'an, China

PB - Institute of Electrical and Electronics Engineers IEEE

ER -