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DC ramp rate effect on the breakdown response of SiO2-BOPP nanocomposites



Otsikko2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)
KustantajaInstitute of Electrical and Electronics Engineers IEEE
ISBN (painettu)978-1-4799-8903-4
DOI - pysyväislinkit
TilaJulkaistu - 2015
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
TapahtumaInternational Conference Properties and Applications of Dielectric Materials - , Austraalia
Kesto: 1 tammikuuta 2015 → …


ConferenceInternational Conference Properties and Applications of Dielectric Materials
Ajanjakso1/01/15 → …


The effect of voltage ramp rate on the short-term dielectric breakdown strength of polymer nanocomposites is not well-documented. In this paper, the effect of DC field ramp rate on the large-area breakdown performance of melt-extruded bi-axially oriented polypropylene (BOPP) films incorporating 4.5 wt-% of nano-silica is studied. By utilizing a self-healing multi-breakdown measurement method with a variable DC voltage ramp rate, a statistically large amount of breakdown data was obtained from a large total sample film area as a function of DC field ramp rate (0.1–50 Vs−1µm−1)). With a decreasing ramp rate, Weibull statistical analysis of the breakdown data suggests a systematically decreasing trend in the breakdown strength (Weibull α) and an increase in the Weibull shape parameter of time (>1) for the nanocomposite. The observed behavior is speculated to be attributable to highly altered internal charge dynamics of the silica-BOPP nanocomposite. The results exemplify the importance of careful breakdown strength assessment when dielectric films of more complex internal structure are studied.