TUTCRIS - Tampereen teknillinen yliopisto


Dynamic laser speckle metrology with binarization of speckle patterns



Otsikko19th International Conference and School on Quantum Electronics: Laser Physics and Applications
ISBN (elektroninen)9781510609532
DOI - pysyväislinkit
TilaJulkaistu - 2017
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
TapahtumaInternational Conference and School on Quantum Electronics -
Kesto: 1 tammikuuta 2000 → …


NimiProceedings of SPIE
ISSN (painettu)0277-786X


ConferenceInternational Conference and School on Quantum Electronics
Ajanjakso1/01/00 → …


Dynamic laser speckle analysis is non-destructive detection of physical or biological activity through statistical processing of speckle patterns on the surface of diffusely reflecting objects. This method is sensitive to microscopic changes of the surface over time and needs simple optical means. Advances in computers and 2D optical sensors forced development of pointwise algorithms. They rely on acquisition of a temporal sequence of correlated speckle images and generate activity data as a 2D spatial contour map of the estimate of a given statistical parameter. The most widely used pointwise estimates are the intensity-based estimates which compose each map entry from a time sequence of intensity values taken at one and the same pixel in the acquired speckle images. Accuracy of the pointwise approach is strongly affected by the signal-dependent nature of the speckle data when the spread of intensity fluctuations depends on the intensity itself. The latter leads to erroneous activity determination at non-uniform distribution of intensity in the laser beam for the non-normalized estimates. Normalization of the estimates, introduces errors. We propose to apply binarization to the acquired speckle images by comparing the intensity values in the temporal sequence for a given spatial point to the mean intensity value estimated for this point and to evaluate a polar correlation function. Efficiency of this new processing algorithm is checked both by simulation and experiment.