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High Temperature and Ageing Test Methods to Characterize the Dielectric Properties of BOPP Capacitor Films

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
Otsikko2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
KustantajaIEEE
Sivut266-269
Sivumäärä4
ISBN (elektroninen)978-1-5386-1194-4
TilaJulkaistu - 2017
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
TapahtumaIEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA -
Kesto: 1 tammikuuta 1900 → …

Conference

ConferenceIEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA
Ajanjakso1/01/00 → …

Tiivistelmä

A large-area high temperature breakdown measurement and an ageing test method are presented. These methods facilitate the development of reliable higher energy density film capacitors by exploiting large measurement areas to provide information on weak point formation and subtle changes in breakdown behavior after electro-thermal or thermal ageing. The test methods were used to characterize two types of highly isotactic biaxially oriented polypropylene capacitor films, which had similar breakdown behavior at room temperature, but different breakdown properties at high temperature and out of which one was more susceptible to electro-thermal DC ageing.

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