TUTCRIS - Tampereen teknillinen yliopisto

TUTCRIS

Insight to Nanoparticle Size Analysis—Novel and Convenient Image Analysis Method Versus Conventional Techniques

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
Artikkeli169
JulkaisuNanoscale Research Letters
Vuosikerta11
Numero1
DOI - pysyväislinkit
TilaJulkaistu - 31 maaliskuuta 2016
OKM-julkaisutyyppiA1 Alkuperäisartikkeli

Tiivistelmä

The aim of this paper is to introduce a new image analysis program “Nanoannotator” particularly developed for analyzing individual nanoparticles in transmission electron microscopy images. This paper describes the usefulness and efficiency of the program when analyzing nanoparticles, and at the same time, we compare it to more conventional nanoparticle analysis techniques. The techniques which we are concentrating here are transmission electron microscopy (TEM) linked with different image analysis methods and X-ray diffraction techniques. The developed program appeared as a good supplement to the field of particle analysis techniques, since the traditional image analysis programs suffer from the inability to separate the individual particles from agglomerates in the TEM images. The program is more efficient, and it offers more detailed morphological information of the particles than the manual technique. However, particle shapes that are very different from spherical proved to be problematic also for the novel program. When compared to X-ray techniques, the main advantage of the small-angle X-ray scattering (SAXS) method is the average data it provides from a very large amount of particles. However, the SAXS method does not provide any data about the shape or appearance of the sample.

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