TUTCRIS - Tampereen teknillinen yliopisto

TUTCRIS

Integrated multi-wavelength mid-IR light source for gas sensing

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
OtsikkoNext-Generation Spectroscopic Technologies XI
KustantajaSPIE, IEEE
ISBN (elektroninen)9781510618251
DOI - pysyväislinkit
TilaJulkaistu - 2018
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
TapahtumaNext-Generation Spectroscopic Technologies - Orlando, Yhdysvallat
Kesto: 16 huhtikuuta 201818 huhtikuuta 2018

Julkaisusarja

NimiSPIE Conference Proceedings
Vuosikerta10657
ISSN (painettu)0277-786X

Conference

ConferenceNext-Generation Spectroscopic Technologies
MaaYhdysvallat
KaupunkiOrlando
Ajanjakso16/04/1818/04/18

Tiivistelmä

Cost effective multi-wavelength light sources are key enablers for spectroscopic applications at Mid-IR wavelength range. Utilizing a novel Mid-IR Si-based photonic integrated circuit filter and wide-band Mid-IR SLEDs, we show the concept of a light source that covers 2.7.3.5 μm wavelength range with a resolution <1nm. The spectral bands are switchable and tunable and they can be modulated. The source allows for the fabrication of an affordable multi-band gas sensor with good selectivity and sensitivity. The unit price can be lowered in high volumes by utilizing tailored molded IR lens technology and automated packaging and assembling technologies. The status of the development of the key components of the light source are reported. The Mid-IR PIC is based on the use of thick-SOI technology, SLED is based on AlGaInAsSb materials and the lenses are tailored single crystal, nonoxide glass and heavy metal oxide glasses fabricated by the use of hot-embossing. The packaging concept utilizing automated assembly tools are depicted. In safety and security applications, the Mid-IR wavelength range covered by the source allows for the detection of several harmful gas components with a single sensor. At the moment, affordable sources are not available. The market impact is expected to be disruptive, since the devices currently in the market are either complicated, expensive and heavy instruments, or the applied measurement principles are inadequate in terms of stability and selectivity.